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Press Releases

ASSET announces new bundle of validation and test tools for Intel Xeon, Core and Atom designs

Tue, September 10, 2013
ASSET announced at the Intel Developers Forum a new bundle of ScanWorks HSIO tools for the Intel Architecture (IA). Previously licensed separately, ScanWorks HSIO for IA now delivers greater value to... read more

Programming on-board flash and EEPROM memory at SPI bus speeds from an FPGA is explained in new eBook

Wed, September 4, 2013
Designers and manufacturing engineers face challenges when it comes to quickly programming flash and EEPROM memories that are already soldered to a circuit board.A new eBook explains the pros and... read more

Faster firmware debug with Intel embedded trace capabilities discussed in new eBook

Wed, August 14, 2013
The complexity and sheer scope of today’s systems with their multiple processors, multiple cores and multi-threaded software can be challenging to developers who are debugging software and firmware.... read more

Testing DDR3 memory with boundary scan / JTAG explored in new eBook by ASSET InterTech

Tue, August 6, 2013
ASSET® InterTech has issued a new eBook on how to test DDR3 memory with non-intrusive JTAG or boundary-scan (IEEE 1149.1) methods. A recent survey of engineers by the International Electronics... read more

ASSET InterTech and Arium join forces to increase visibility into complex system development

Tue, July 9, 2013
ASSET InterTech today acquired the business of Arium, provider of software debug tools for systems based on Intel and ARM processors. read more

ASSET’s new eBook explains how to recover the costs sunk into circuit boards that will not boot

Thu, June 6, 2013
A new eBook from ASSET InterTech , will help circuit board manufacturers who want to recover their investment in assembled boards that won’t boot – so called dead boards – and still maintain the... read more

ASSET ScanWorks is among the first tools to support the new on-chip Intel Silicon View Technology

Mon, June 3, 2013
With the introduction today of Intel® Silicon View Technology (Intel® SVT), ASSET® InterTech’s ScanWorks® platform for embedded instruments becomes the only platform in the industry that fully... read more

How to do functional tests on I2C and SPI monitors with JTAG is explored in new eBook from ASSET InterTech

Wed, May 8, 2013
A new eBook from ASSET explains how the structural test methodology based on the IEEE 1149.1 boundary scan standard, known as JTAG, can apply functional tests to I2C and SPI system monitors during... read more

New PXI controller for ASSET’s ScanWorks platform supports four test technologies

Tue, April 23, 2013
With the new PXI-based controller for ASSET® InterTech’s ScanWorks® platform for debug, validation and test, engineers can test circuit boards with four different toolsets, each based on a different... read more