ASSET InterTech's Boundary-Scan Test, Processor-Controlled Test and Intel® IBIST form a unique set of tools for access to, and control of embedded instrumentation.

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Bob Greenfield
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UPCOMING EVENTS

ASSET InterTech, Inc. invites you to visit us at any one of the below exhibits to learn about ScanWorks® for Embedded Instrumentation for boundary-scan test, processor-controlled test, Intel® Interconnect BIST (IBIST) and Core Instrumentation.

 

US TRADESHOWS OR EVENTS

Date:	Exhibition:	Booth/Stand Number:
September 14-17	Autotestcon 2009 - Anaheim, CA	Booth 410
September 22-24	Intel Developer Forum 2009 - San Francisco, CA
November 1-6	International Test Conference (ITC) - Austin, TX	Booth 415

 

 

EUROPE TRADESHOWS OR EVENTS

Date:	Exhibition:	Booth/Stand Number:
March 3 - 5	Embedded World - 2009, Nürnberg, Germany	Hall 11.0 Stand 125
November 10-13	Productronica 2009 - Munich, Germany