ASSET InterTech's Boundary-Scan Test, Processor-Controlled Test and Intel® IBIST form a unique set of tools for access to, and control of embedded instrumentation.

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Bob Greenfield
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UPCOMING EVENTS

ASSET InterTech, Inc. invites you to visit us at any one of the below exhibits to learn about ScanWorks® for Embedded Instrumentation for boundary-scan test, processor-controlled test, Intel® Interconnect BIST (IBIST) and Core Instrumentation.

 

SEMINARS, TRADESHOWS OR EVENTS

Date:	Event:
March 2-4, 2010	Embedded World 2010 Hall 11, Stand 125 Nürnberg, Germany Click here to see our 4 minute preview movie.
March 8-12, 2010	DATE 2010/SDD 2010 Paper Presentation Dresden, Germany
April 18-21, 2010	VTS (VLSI Test Symposium) Paper Presentation Santa Cruz, CA
May 5-6, 2010	SiliconAid SWDFT (SouthWest DFT Conference) Austin, TX
September 13-16, 2010	Autotestcon - Orlando, FL
September 2010	BTW (Board Test Workshop) Fort Collins, CO
September, 2010	IDF (Intel Developers Forum) San Francisco, CA
September	ITSW (International Test Synthesis Workshop) Santa Barbara, CA
November, 2010	ITC (International Test Conference)/D3T Workshop Austin, TX
November 9-12, 2010	Electronica Munich, Germany
December, 2010	Nordic Test Forum (NTF) Stockholm, Sweden