Almost all boards today have test access issues due to the combination of functional density and board size. Boundary scan has been the leading board test technology to address lack of access and the more boundary scan devices you have - the better test coverage. But boundary scan has it limits in test coverage where devices don’t have boundary scan or you need a broader fault spectrum than just shorts and opens, especially with today’s high-speed SerDes IO technologies and various bus topologies. ScanWorks Processor-based Function Test (PFT) and DRR Test (PFTDDR) are the answers to solve those tough problems.
When Maximizing Test Coverage matters…ScanWorks PFTDDR and PFT deliver
When designing with the latest DDR (DDR2, DDR3, DDR4, LPDDR) memories, having the correct DDR configuration parameters are critical, especially when dealing with ECO like the DDR memories device change or a spin of the PCB. With the demand to deal with multiple DDR memory supplies increasing, testing of memories becomes a critical step in delivering a quality product. A comprehensive set of memory tests are required and the ability to deal with an ECO to account for the configuration or calibration factors. ScanWorks PFTDDR provide the test engineer the tools and flexibility to deal with changes in production.
When Optimizing Memory System Performance matters…ScanWorks PFTDDR delivers
Today's designs use large SD/MMC/eMMC flash components. ScanWorks Processor-based Fast Programming provides IP to enable device programming at device speeds. Thus, enabling dynamic in-system programming during production and eliminating other costly programming steps.
ScanWorks Processor-based Function Test (PFT) has two versions: One for ARM 32-bit processors and another for ARM 64-bit processors. The 32-bit version supports both the Xilinx Zynq-7000 and NXP i.MX6 IO busses on those devices. The 64-bit version support the Xilinx Zynq Ultrascale+ IO busses on that device. Both versions include device specific target agents that enables testing of the IO busses and devices. The target agents are download into the SoC memory and then use the ARM processor as the test engine.
PFT provides fast testing of bus devices and are determined by the SoC architecture. All testing is done at-speed which will catch problems with cross talk or injected noise that escape other forms of structural testing. PFT requires no boot-loaders, OS or drivers to be loaded thus providing an excellent platform for production and prototype testing.
Supports device interface and connection testing of
ScanWorks Processor-based Functional Test for DDR provides the fastest means in assisting designers with optimal DDR configurations and shorting the test development cycle, thus keeping the development on schedule. Like the other members of the ScanWorks PFx family (Processor-based Fast Programming, Processor-based Functional Test) Processor-based Functional Test for DRR uses the core portion, CPU and OCM (On Chip Memory), of the SoC as the target for the controlling agent. This firmware will lessen the knowledge burden for DDR calibration, tuning, and functional test development. It provides everything needed for a fast and comprehensive solution for configuration and testing of all DDR memory. The memory tests include:
Walking 0’s and 1’s
Address Line Test
Data Bus Noise Test
Memory Cell Test
Address March Test
Burst Transfer Test
Simultaneous Switching Output Test
This firmware has no need of an operating system or boot loader, thus is perfect for early prototype board development. ScanWorks Processor-based Functional Test for DDR is designed to enable time savings in development and to increase product quality for ARM Cortex based SoC’s from Xilinx and NXP. ARM based SoCs provide a powerful platform for product development in many market segments such as Defense, Automotive, Embedded Vision, IoT and IIoT. The common tread in all these markets is developing with DDR memories.
The benefit of the SoC reducing chip count comes with a cost in terms of additional knowledge requirements for both development and manufacturing test in configuration of the embedded DDR memory controller. ScanWorks PFx reduces the knowledge burden and increases quality. The combination of ScanWorks and the right ARM SoC will ensure your development project is a success.
ScanWorks Processor-based Fast Programming (PFP) is a simple tool to quickly develop a device programming action to be added to your production test program. A processor specific target-resident agent is the key proprietary ScanWorks technology that enables fast flash programming. The agent is automatically downloaded into the SoC, which is the engine that programs the flash device at device speeds.
Product by Processor supported:
The ScanWorks platform for embedded instruments is supported by a wide variety of hardware controllers and accessories with which engineers can connect ScanWorks to their unit under test (UUT). Hardware is available for development, production and repair environments. The test platform required for ScanWorks is either a standard PC or a system with a built-in (embedded) JTAG controller.