ASSET INTERTECH SITE MAP

• Test Development Station Bundle
• Interconnect Development Station Bundle

• Diagnostics & Repair Station Bundle
• Interconnect Repair Station

• Manufacturing Station

• Programming Stations

• Extended JTAG Coverage
  - Presentation    - Extended JTAG Presentation
  - Video              - Extended JTAG Coverage video
  - Press Announcement - Extended JTAG Coverage Press Announcement

• ScanWorks Medalist
  - ScanWorks Medalist for the 3070

• ScanWorks Intel® IBIST

• Hardware Overview
• Hardware Accessories
• Controllers & Interface Pods
  - Hardware Controller Options - PCI-100 (pg2) | PXI-100 | PCI-400 (pg2) | USB-100
• Buffer Boards
• IO Modules

• Interconnect Development Station Bundle pg2, pg3, pg4, pg5, pg6, pg7, pg8
• Test Development Station Bundle pg2, pg3, pg4, pg5, pg6, pg7, pg8, pg9, pg10, pg11
• Interconnect Repair Station pg2, pg3, pg4
• Diagnostics & Repair Station Bundle pg2, pg3, pg4
• Manufacturing Station pg2
• Programming Station pg2
• PLD Program Generation
• Flash Memory Program Generation pg2
• Extended JTAG Coverage pg2
• ScanWorks High-Speed Busses
• PCI-100 Hardware Kit pg2
• PXI-100 Hardware Kit
• PCI-400 Hardware Kit pg2
• USB-100 Hardware Kit
• Boundary Scan 400 IO Module
• Design Browser
• Memory Access Verification pg2, pg3
• Interactive Debug and Analysis pg2
• Net List Merging
• Network Licensing
• Interconnect Pin-Level Diagnostics pg2
• Interconnect Test Generation

• New to JTAG/Boundary Scan?
• Introduction to Boundary-Scan Whitepaper pg2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28
• Chip and Board Testability Assessment Checklist
• Boundary Scan Tutorial
• Guidelines for Device Design For Test (DFT)
• Guidelines for Board Design For Test (DFT) Part 1
• Guidelines for Board Design For Test (DFT) Part 2
• DFT Guidelines (video)
• Economics of Boundary Scan (video)
• Boundary Scan Introduction (video)
• IEEE 1149.6 (video)
• IEEE 1532 (video)

• Partner Provider
• BSDL Validation
• Test Development Services
• Consulting Services

• Levels Of Support
• DFT Checklist
• Support Wizard

• Things You Use - Boundary Scan (JTAG) | BGA Packaging | High Density Boards
• Things You Do - Test Development | Flash Programming | CPLD/FPGA Programming
• Where Problems Occur - Prototype Design & Debug | Manufacturing Test | Field Test & Repair

• Boundary Scan Basics and ScanWorks Test Development Training - Sign Up Now
• Design for Test (1-5 day class)
• Design for Test (2 day class)
• Design for Test Half-Day Seminar
• Introduction to Boundary Scan
• Diagnostics and Repair Trainingw
• Free Training - Boundary Scan Tutorial | Guidelines for Device DFT | Guidelines for Board DFT P1 | Guidelines for Board DFT P2

• Management
• Strategic Relationships
• Employment
• Upcoming Events

• Client Stories - ADC Telecom | AETA.COM | DigiDesign | Hewlett Packard | Jabil | Lucent Technologies | MediaTek | Mercury Computer Systems | Navini Networks | NeoScale Systems | Netrix | Qlogic | Raytheon and ODS | Reptron Manufacturing | SMT Unlimited | Tellabs | Defense Vendor
• Industry Stories - Communications/Networking | Avionics/Defense | Computer | Electronic Manufacturing Services
• Topic Stories - Test Re-Use | Improved Productivity/Ease of Use | Improved Product Quality/Reduced Defects | ISP | Fast Return on Investment | EDFT Services | Manufacturing Test | ICT Integration

• April 2005
  • Medalist ScanWorks marks a new phase for the ASSET-Agilent Relationship
  • When are tests good enough? ScanWorks’ fault reports lead to better tests, better test coverage
  • French telecom firm shares a ScanWorks license between two facilities 800 km apart
  • ASSET web site gets a face lift
  • And the winner is….ScanWorks for second year in a row!
  • Concurrent programming could increase efficiency by 30 percent
  • Medalist ScanWorks is Agilent’s premiere JTAG tool on the new i5000 ICT and all 3070 systems
  • Webster has been committed to ScanWorks and boundary scan
• December 2004
  • We do boundary scan right!
  • System test with boundary scan
  • ScanWorks will be first to support Intel’s next-generation design validation and test methodology – Intel® IBIST
  • ScanWorks becomes the first JTAG system with processor emulation for extended test coverage
  • ScanWorks tackles high-speed Gb/sec buses with new 1149.6 capabilities
  • Win an iPod! Add to ASSET’s growing library of non-boundary scan device models
  • New ScanWorks shows versatility of boundary scan
  • EMS firm finds that ScanWorks pays for itself by saving "money, time and company resources"
• August 2004
  • Test Re-Use: An Idea Whose Time Has Come
  • Enhancements to ScanWorks include the latest test advancements
  • Leading DVD chipset supplier turns to ScanWorks to ensure quality of devices
  • ScanWorksAPI easily integrates JTAG tests into NI’s LabView, TestStand and others
  • ASSET’s chief technologist will present on 1149.6 testing at third annual Board Test Workshop
  • Agilent and ASSET collaborate on new 3070 test re-use products
  • NOW PLAYING! New ScanWorks videos show how easy boundary scan can be
• May 2004
  • Clearing the air on multiple scan paths
  • ScanWorks Version 3.4 – What else is coming?
  • Simplicity of ScanWorks speeds up HP’s time-to-test
  • Sophisticated device modeling is key to optimizing automatic test generation
  • Lead-free solder may shift test methods toward boundary scan
  • New Partner Provider to support fast growing Asian market
• January 2004
  • Value of ScanWorks® shines on every segment of marketplace
  • Discovering ease-of-use with a new Assistant
  • ScanWorks® tracks down faults missed by other test methods
  • Boundary scan and CPU emulation team up to increase product quality
  • ScanWorks® maintenance is founded on solid support, but offers much more
  • Guidelines help smooth the implementation of new TopCAT features
  • Scripting automates labor-intensive gaps in manufacturer's test processes
• September 2003
  • New boundary-scan standard (IEEE Std 1149.6) will test high-speed interconnects
  • Test strategies improve when boundary scan teams up with functional test
  • ScanWorks/3070 saves Lucent $1 million
  • Hardware options supporting ScanWorks are many and varied
  • TopCAT automation and productivity enhancements highlight new ScanWorks 3.3.2
  • New TopCAT automation technology for ScanWorks unveiled at ITC (Booth 1328)
  • PXI controller enhances ScanWorks' compatibility with NI's test executives
  • PXI State of the Union
  • New Four-TAP Buffer Pod improves test coverage and throughput
• May 2003
  • Get Connected
  • How Process Automation Scripting cuts test development time from days to minutes
  • ScanWorks reduces test costs and improves coverage for Vivace Networks' extremely complex boards
  • ScanWorks 3.3 reduces memory test development times
  • New multiple-port PCI-400 controller adds to the speed and flexibility of ScanWorks™
  • Two new ScanWorks web libraries make test and programming development easier
  • Linking manufacturing to design with boundary scan
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• 2005
• March 25, 2005 - ASSET® and American Atrium support next-generation embedded test on Intel® processors and chipsets
• March 8, 2005 - French telecom firm deploys ASSET® ScanWorks® JTAG test system in design and manufacturing
• March 1, 2005 - ASSET® names Logic Technology to support and distribute the ScanWorks® JTAG system in Germany
• Feb. 22, 2005 - ASSET® ScanWorks® JTAG system integrated into new Agilent Medalist i5000 In-Circuit Test platform
• Feb. 14, 2005 -ASSET® integrates Lattice’s in-system configuration engine into its ScanWorks® JTAG system
• Jan. 10, 2005 - ASSET’s ScanWorks® JTAG system named “Best in Test” for high-speed bus testing
• 2004
• Nov. 16, 2004 - ASSET's design-for-test (DFT) services tapped by Xilinx for PLD boundary-scan validation
• Oct. 26, 2004 - ASSET’s ScanWorks® is first JTAG system capable of testing high-speed Gb/sec nets
• Sept. 20, 2004 - ASSET’s ScanWorks® is first boundary scan system with processor emulation for extended test coverage
• August 17, 2004 - ScanWorksAPI easily integrates JTAG test into NI’s LabView, TestStand and others
• Aug. 16, 2004 - ASSET® tools align with Intel’s next-generation embedded test technology
• July 13, 2004 - ASSET® InterTech expands its management team to take advantage of growth opportunities
• July 7, 2004 - ASSET expands European support for ScanWorks® JTAG test system
• June 29, 2004 - ASSET opens direct support office in Hong Kong
• June 17, 2004 - ASSET and Agilent Technologies Collaborate on Products That Span Benchtop Boundary-Scan Stations and High-Volume 3070 Test Systems
• June 8, 2004 - New ScanWorks bundle makes boundary scan easy and affordable for first-time and occasional JTAG test users
• May 10, 2004 - Unitestech agrees to distribute ASSET’s ScanWorks® JTAG system in Korea
• April 26, 2004 - iNETest joins ASSET's Partner Provider program to serve fast growing Asian JTAG market
• February 24, 2004 – ScanWorks® Assistant™ accelerates “time-to-test” for first time users of JTAG/boundary scan
• January 15, 2004 - TopCAT™ technology for JTAG test snaps up Best In Test honorable mention
• 2003
• September 30, 2003 - New TopCAT™ JTAG technology dramatically reduces boundary scan test development time
• August 18, 2003 - New PXI controller for ASSET ScanWorks enhances compatibility with National Instruments' test executives in functional test
• April 23, 2003 - JTAG Seminar demonstrates the benefits of integrating product performance intelligence with boundary-scan test
• March 17, 2003 - New service validates accuracy of an integrated circuit's boundary-scan description file
• 2002
• December 16, 2002 - APG brings extensive JTAG and 3070 expertise to ASSET EDFT's Partner Provider program
• October 22, 2002 - TTA joins ASSET's Partner Provider program
• October 8, 2002 - New multiple-port controller makes ASSET's ScanWorks the industry's fastest, most flexible boundary-scan manufacturing test system
• October 2, 2002 - ASSET's Partner Provider program adds The Test Connection
• September 23, 2002 - New ScanWorks™ boundary-scan system improves the memory access testing process
• September 5, 2002 - Vivace Networks is first to require ASSET's ScanWorks on contract manufacturers' Agilent 3070 ICT systems
• August 20, 2002 - Solution Sources becomes first U.S. firm to join ASSET's Partner Provider Program
• June 19, 2002 - Fourth Article from ChipCenter.com. The Center of the Electronics Universe
• June 1, 2002 - Boundary Scan for Better Products. An EP&P Article.
• June 17, 2002 - Partner Provider program for ASSET's EDFT will accelerate test translation in manufacturing
• May 22, 2002 - Third Article from ChipCenter.com, The Center of Electronics Universe
• April 30, 2002 - Vivace Networks reduces test costs and shortens its time-to-market with ASSET's ScanWorks
• April 2, 2002 - Second Article from ChipCenter.com, The Center of the Electronics Universe
• February 26, 2002 - First Web-based e-Learning for boundary scan is centerpiece of ASSET's Internet strategy
• February 22, 2002. Article from ChipCenter.com, The Center of the Electronics Universe
• 2001
• December 3, 2001 - ASSET InterTech named one of the fastest growing private companies in North Texas
• October 29, 2001 - Agilent Technologies and ASSET InterTech Collaborate to Reduce Development Costs for Electrical Test
• October 15, 2001 - PLX Technology to Provide BSDL Files Validated by ASSET InterTech's EDFT Services
• September 27, 2001 - ASSET's ScanWorks wins competition as World Wide Packets' boundary-scan test environment
• September 24, 2001 - New center in Atlanta enlarges ASSET InterTech's training facilities to five US cities
• August 27, 2001 - New ScanWorks™-EL helps first-time users to quickly gain the benefits of boundary scan
• July 23, 2001 - Experienced engineering manager from Compaq joins ASSET InterTech
• July 16, 2001 - Leading supplier of IP storage switches selects ASSET's ScanWorks for boundary-scan test
• July 9, 2001 - Longtime financial professional joins ASSET InterTech as CFO
• June 25, 2001 - Leader in digital audio systems chooses ASSET ScanWorks for boundary-scan deployment