Improving and Removing Blind Spots in Medical Device Testing
Improving and Removing Bling Spots in Medical Device Testing In the realm of medical devices, precision isn’t optional—it’s imperative. Every circuit, sensor, and embedded system must perform flawlessly, because lives depend on it. Aligning ISO 13485, which is key for medical device quality systems, with IEEE 1149.1 (JTAG) is essential. IEEE 1149.1 is the standard […]
IEEE 1149.1-2013: Excludable Segments
The 2013 Revision of the IEEE 1149.1 Standard incorporates support for dynamic data registers that can change in length and organization, unlike those fixed ones specified by the 2001 Revision. This allows, for example, definition of “excludable segments” for the boundary scan register (BSR); perfect for dealing with BSR segments in different power domains, some […]
The IEEE 1149.1-2013 Standard for Test Access Port and Boundary-Scan Architecture: An Overview
I’ve had the opportunity to spend some time reviewing the 2013 Revision of the classic IEEE 1149.1 Standard. And, the technology introduced by this Standard is starting to make its way into the market. What is this technology, and why has it taken so long to gain adoption? Those who might follow me via our […]