Manufacturing Test Archives | Page 2 of 6

Fast test and programming tools from ASSET streamline production for Xilinx Zynq UltraScale+ systems

Thursday, October 11, 2018

Faster flash programming with ScanWorks enhances production throughput ScanWorks’ automated functional test at processor speeds finds the toughest faults quickly Faster test and programming tools from ASSET® InterTech will accelerate the development and production of system designs based on Xilinx Zynq UltraScale+ Multiprocessor SoCs (MPSoC). These new tools for the…

ASSET’s fast test and programming tools for NXP i.MX 6 application processors accelerate design and production

Wednesday, September 19, 2018

In development, ScanWorks automates complex DDR tuning to optimize memory performance In manufacturing, faster flash programming with ScanWorks enhances throughput In repair, ScanWorks’ automated functional test at processor speeds finds the toughest faults quickly Faster test and programming tools from ASSET® InterTech will accelerate development and production cycles for…

ASSET’s fast test and programming tools for Xilinx Zynq-7000 SoC systems accelerate design and production

Thursday, August 9, 2018

ASSET announces advanced support for Teradyne HSSub PXIe systems

Thursday, September 7, 2017

Richardson, TX, and North Reading, MA – ASSET® InterTech (www.asset-intertech.com), the leading supplier of tools for embedded instrumentation, and Teradyne® (www.teradyne.com), the leading supplier of automatic test equipment (ATE), will exhibit the extended integration of the JTAG and boundary-scan test capabilities of ASSET’s ScanWorks® platform for embedded instruments into…

ASSET releases new benchtop and remote debugging applications for Intel Xeon Processor Scalable Family

Tuesday, July 11, 2017

Tools for unprecedented debug visibility now available on new generation server platforms Intel® today announced the new Intel Xeon® Processor Scalable Family (codename Purley, or Skylake-EP), representing the biggest platform advancement of the decade for secure, agile, multi-cloud data centers. With performance gains greater than 1.65X the previous generation…

High-End Defense System uses ScanWorks Embedded Diagnostics for In-Situ Boundary-Scan Test

Tuesday, June 20, 2017

ASSET InterTech awarded multi-year contract Mission-critical systems industries such as Avionics and Military are expected to operate 24 X 7 with close to zero outage downtime. To achieve this level of performance, such systems must combine high reliability with rapid field repair and replacement of the defective line-replaceable units…

Circuit Check and ASSET InterTech collaborate on boundary-scan test solutions

Tuesday, January 17, 2017

Companies combine the power of ASSET’s boundary-scan test tools with Circuit Check’s (CCI) flexible, configurable Functional Test Stations for best-in-class test coverage at lowest cost. Minneapolis, Minnesota – Circuit Check Inc., a global leader in test, automation and interfacing solutions for electronics and electro-mechanical device manufacturers, announced a collaboration with…

ASSET’s ScanWorks for Intel platforms speeds structural and functional test on prototype and production circuit boards

Wednesday, July 13, 2016

Test without booting, extensive diagnostics to bit-level of memory The newly enhanced processor-controlled test (PCT) tool on ASSET® InterTech’s ScanWorks® platform can perform structural and functional test, as well as diagnostics, in one pass and still achieve the high test speeds required on manufacturing lines. ASSET is a leading…

At-speed in-system programming of flash memory enhanced with ScanWorks FPGA-Controlled Test and IJTAG

Tuesday, August 25, 2015

New capability takes advantage of an IJTAG network with programming engines embedded in an onboard FPGA Programming memory in-system, or after the devices have been soldered to a circuit board, is the most efficient method, but the challenge for design and manufacturing engineers has always been the slow speeds…

In-system flash programming 1,000x faster via IJTAG explained in new eBook

Tuesday, July 28, 2015

New faster methods for the in-system programming of onboard flash as well as I2C and SPI memory are explained in a new eBook published by ASSET InterTech. In-system programming has many advantages over standalone programming stations, but, until now, its programming speed has presented a challenge for design and…

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