How To Test High-Speed Memory With Non-Intrusive Embedded Instruments

Accelerate Testing. Eliminate Firmware Dependencies.

Why It Matters

One of the most pressing problems for system manufacturers is testing memory and memory buses on circuit boards. The speeds are simply too high, and signals get easily distorted when touched by probes. Today there are a number of new Non-intrusive Board Test (NBT) techniques available. Each method has its advantages and disadvantages over the others. Al Crouch, previous co-chairman of the IEEE P1687 IJTAG committee, provides the ins and outs.

What and where is the problem?

DDR and high-speed memory structures

Memory test in general

Soft access test methods and techniques

FPGA- and ASIC-based memory test

Intel®’s Interconnect Built-In Self Test (IBIST)

What You'll Learn

Download the eBook

Fill out the form to access this ebook and you will learn about memory test methods and their tradeoffs. In particular some of the complexities in testing high-speed DDR (Double Data Rate) memory buses.