Category: Embedded Diagnostics

Remote CScripts application using the Emulex Pilot4 BMC

Alan Sguigna

April 10, 2016
4:08 pm

In a previous blog, I described how the ScanWorks Embedded Diagnostics (SED) utility runs Intel CScripts nearly as fast as legacy methods. This applies in particular using the Emulex Pilot4 BMC, with its on-chip JTAG Master.

Performance of Intel Customer Scripts (CScripts)

Alan Sguigna

March 6, 2016
8:52 pm

In a previous blog, I shared some prospective information on the real-time performance of Intel CScripts, when run on our SourcePoint debugger, versus legacy methods. This article contains quantitative measurements, and supports the theory that SourcePoint yields much higher throughput.

Catastrophic errors (IERR) on Intel-based systems

Alan Sguigna

December 20, 2015
5:15 pm

Catastrophic events within an Intel processor will often manifest themselves with a “hung” or “wedged” system. What causes these events, and how can they be resolved?

Remote Application of Intel CScripts

Alan Sguigna

October 11, 2015
5:00 pm

Intel CScripts are very valuable for debug and validation of everything from smartphones to servers. They acquire even more power when they can be applied remotely.

High Availability within Software-Defined Networks

Alan Sguigna

September 27, 2015
5:48 pm

As network functions become virtualized and proprietary hardware migrates to commodity Intel-based servers, will Carrier service levels degrade?

JTAG Boundary-Scan Test for the Intel Innovation Engine

Alan Sguigna

September 13, 2015
3:23 pm

As described in earlier blogs, the new Intel Innovation Engine (IE) makes an ideal host for validation, debug, trace and test applications on Intel platforms. This article details the implementation of a JTAG execution engine on the IE for the purposes of printed circuit board structural and functional testing.

Using the Intel Innovation Engine for Embedded DDR4 Memory Test

Alan Sguigna

September 7, 2015
3:28 pm

Last week, I wrote about Intel’s public announcement of the Innovation Engine (IE), an Intel architecture processor and I/O sub-system embedded into their upcoming generations of server platforms. This article describes the use of the IE for JTAG boundary-scan testing of memories.

Intel Innovation Engine with ScanWorks Embedded Diagnostics

Alan Sguigna

August 30, 2015
3:57 pm

Just this past week, Intel announced the Innovation Engine, a small Intel architecture processor and I/O sub-system embedded into their upcoming generations of server platforms. What is its purpose, and what new applications can run on it?

Embedded Boundary-Scan Test

Alan Sguigna

August 2, 2015
6:09 pm

Boundary-scan test is used commonly on manufacturing lines with a “benchtop” tester, complete with cables, fixturing, hardware probes, and so on. What are the pros and cons of embedding this technology in-situ?

A new era and new insight – Real Insight

Glenn Woppman

July 13, 2015
1:21 pm

Category: Embedded Diagnostics

Remote CScripts application using the Emulex Pilot4 BMC

Performance of Intel Customer Scripts (CScripts)

Catastrophic errors (IERR) on Intel-based systems

Remote Application of Intel CScripts

High Availability within Software-Defined Networks

JTAG Boundary-Scan Test for the Intel Innovation Engine

Using the Intel Innovation Engine for Embedded DDR4 Memory Test

Intel Innovation Engine with ScanWorks Embedded Diagnostics

Embedded Boundary-Scan Test

A new era and new insight – Real Insight

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