Category: Industry Standards and Forums

Testing DDR3 and DDR4 memory – Part 2

Alan Sguigna

August 3, 2012
4:52 pm

In my last Blog, I wrote about the iNEMI report on how testing memories is one of the top three problems engineers face today. Why is memory test so important?

The Limitations of Boundary Scan on ICT

Alan Sguigna

May 28, 2012
4:12 pm

Many legacy In-Circuit Testers (ICT) support some kind of boundary scan for structural testing, to address limited access issues. But are these as good as advertised?

Pollution, Power Margins, and SerDes Problems

Alan Sguigna

May 20, 2012
8:59 pm

PCI Express Loopback and PCI-SIG

Eric Johnson

April 18, 2012
2:01 pm

When Gigabit Ethernet isn’t fast enough

Alan Sguigna

March 25, 2012
2:43 pm

My neighbor’s son ripped out all the Cat 5e cable in his house and replaced it with Cat 6 cable. Why did he do that?

Can Test be a strategic asset?

Alan Sguigna

February 26, 2012
1:27 pm

Martin Rowe, senior technical editor of Test & Measurement World magazine, posed this question in a recent blog. What do you think?

Fast Flash Programming

Alan Sguigna

February 12, 2012
4:07 pm

Programming NOR or large NAND flash devices can be done using a variety of technologies, including boundary scan (JTAG), processor-controlled test (emulation), or FPGA-controlled test. Which embedded instrument you use is a trade-off between speed, complexity and cost.

Overclockers Unite!

Alan Sguigna

January 29, 2012
4:31 pm

The new Sandy Bridge E (Enthusiast) processors are a gamer’s delight. With the new LGA2011 socket and X79 chipset, Intel Sandy Bridge-E series processors come with enhanced performance overclocking support. But is it worth the money?

Performance versus Conformance Testing

Alan Sguigna

January 22, 2012
11:38 am

OEMs in the telecom industry invest in verifying the performance and conformance of the high-speed interconnects off their gear. Does the same approach apply to chip-to-chip interconnects, and in other industries?

Don’t be Intrusive!

Alan Sguigna

October 8, 2011
3:48 pm

Ever heard the old saw about the guy (gal) that “went to a fight and a hockey game broke out”? I’d characterize the ongoing debate on the value and longevity of In-Circuit Test (ICT) as a bit of a brawl…

Category: Industry Standards and Forums

Testing DDR3 and DDR4 memory – Part 2

The Limitations of Boundary Scan on ICT

Pollution, Power Margins, and SerDes Problems

PCI Express Loopback and PCI-SIG

When Gigabit Ethernet isn’t fast enough

Can Test be a strategic asset?

Fast Flash Programming

Overclockers Unite!

Performance versus Conformance Testing

Don’t be Intrusive!

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