Industry Standards and Forums Archives | Page 7 of 8

What is JTAG? and What is IJTAG?

Alan Sguigna

July 4, 2011
11:50 am

I’m sometimes asked how JTAG, IJTAG and boundary scan all relate to one another. Here’s a short explanation.

IEEE P1687 and In-Circuit Test (ICT)

Alan Sguigna

June 5, 2011
9:43 am

Run IEEE P1687-based tests at ICT? I don't think so...

The test stack

Alan Sguigna

February 20, 2011
9:20 am

Those of you with a telecom background are no doubt aware of the “OSI Network Model”, also known as the OSI pyramid or stack. It is a way of sub-dividing a communications system into smaller parts called layers. A layer is a collection of similar functions that provide services to the layer above it and receives services from the layer below it. A decade ago, the telecommunications test industry underwent a revolution when platforms emerged that could cover multiple layers of the OSI stack. Now, the same thing is happening in the circuit board test industry...

Test coverage using multiple technologies

Alan Sguigna

January 10, 2011
9:17 pm

It is a well-known fact that manufacturing test strategies must involve a combination of inspection, structural, and functional test technologies in order to yield highest quality and minimize customer returns. But a new breed of non-intrusive, software-based technologies promises to disrupt legacy test solutions by guaranteeing the highest test coverage at the lowest cost. These technologies leverage off of the embedded instruments within silicon to achieve this goal in the following ways...

Structural versus Functional Test, and Test Coverage versus Diagnostics

Alan Sguigna

December 9, 2010
5:32 pm

What’s the difference between circuit board structural test and functional test? And how does test coverage relate to diagnostics? These terms are sometimes used interchangeably, but not knowing the difference may result in a less-than-optimal test methodology. Let me explain…

ASSET receives prestigious Frost & Sullivan award

Alan Sguigna

December 5, 2010
4:03 am

ASSET has been awarded the prestigious 2010 Innovation of the Year Award in the PCB automated test equipment category by Frost & Sullivan. This distinguished award is a tremendous third-party validation of ASSET’s embedded instrumentation strategy, and is based upon our drive to reduce test costs in the face of increasingly complex test challenges...

A week at ITC

Alan Sguigna

November 12, 2010
5:26 am

Last week, ASSET unveiled the first toolkit for IEEE 1687 at the International Test Conference (ITC) in Austin, TX. ITC is the cornerstone of “Test Week”, a premiere technical event which addresses the challenges of providing high-quality, cost-effective test solutions for chips, boards and systems...

High Speed I/O Testing on In-Circuit Test

Alan Sguigna

November 4, 2010
6:19 pm

Because ASSET is a pioneer in the use of non-intrusive solutions for validation, test and debug (using what we call “embedded instrumentation”), we often get asked if legacy testers like In-Circuit Test (ICT) machines can be used for the testing of high-speed I/O...

Who will use IEEE 1687?

Larry Osborn

September 14, 2010
4:38 am

The IEEE 1687 standard resonates with engineers and managers, no matter which part of the semiconductor-based product lifecycle they are involved with, because it either solves a technical problem, it provides a cost advantage, it reduces the amount of work, or it enables automation of some (onerous) task…

What is IEEE 1687?

Michael Johnson

August 20, 2010
6:43 pm

This is the first of a series of blogs answering the question, “what is IEEE 1687”. Subsequent blogs will cover the topics “who uses IEEE 1687”, “what are the advantages of using IEEE 1687 (why use IEEE 1687)”, and “how to use IEEE 1687.”

Category: Industry Standards and Forums

What is JTAG? and What is IJTAG?

IEEE P1687 and In-Circuit Test (ICT)

The test stack

Test coverage using multiple technologies

Structural versus Functional Test, and Test Coverage versus Diagnostics

ASSET receives prestigious Frost & Sullivan award

A week at ITC

High Speed I/O Testing on In-Circuit Test

Who will use IEEE 1687?

What is IEEE 1687?

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