Industry Standards and Forums Archives | Page 7 of 8

What is P1838 3D test?

Al Crouch

August 12, 2011
5:50 pm

Although it has been in the news for quite a while, one of the methods thought to be the way to extend Moore’s Law is finally reaching the point where it may be deployed in the near future — 3D Silicon Integration…

P1838: the 3D Standard and its use with 1687

Al Crouch

August 11, 2011
2:00 pm

One of the newest IEEE Standards Committees is currently defining the P1838 3D Test Standard. The main goal of P1838 is to develop a “Per Die” Access Mechanism that becomes a “Stacked Die” Access Mechanism when the individual die are stacked into 3D silicon. Find out more…

What is JTAG? and What is IJTAG?

Alan Sguigna

July 4, 2011
11:50 am

I’m sometimes asked how JTAG, IJTAG and boundary scan all relate to one another. Here’s a short explanation.

IEEE P1687 and In-Circuit Test (ICT)

Alan Sguigna

June 5, 2011
9:43 am

Run IEEE P1687-based tests at ICT? I don't think so...

The test stack

Alan Sguigna

February 20, 2011
9:20 am

Those of you with a telecom background are no doubt aware of the “OSI Network Model”, also known as the OSI pyramid or stack. It is a way of sub-dividing a communications system into smaller parts called layers. A layer is a collection of similar functions that provide services to the layer above it and receives services from the layer below it. A decade ago, the telecommunications test industry underwent a revolution when platforms emerged that could cover multiple layers of the OSI stack. Now, the same thing is happening in the circuit board test industry...

Test coverage using multiple technologies

Alan Sguigna

January 10, 2011
9:17 pm

It is a well-known fact that manufacturing test strategies must involve a combination of inspection, structural, and functional test technologies in order to yield highest quality and minimize customer returns. But a new breed of non-intrusive, software-based technologies promises to disrupt legacy test solutions by guaranteeing the highest test coverage at the lowest cost. These technologies leverage off of the embedded instruments within silicon to achieve this goal in the following ways...

Structural versus Functional Test, and Test Coverage versus Diagnostics

Alan Sguigna

December 9, 2010
5:32 pm

What’s the difference between circuit board structural test and functional test? And how does test coverage relate to diagnostics? These terms are sometimes used interchangeably, but not knowing the difference may result in a less-than-optimal test methodology. Let me explain…

ASSET receives prestigious Frost & Sullivan award

Alan Sguigna

December 5, 2010
4:03 am

ASSET has been awarded the prestigious 2010 Innovation of the Year Award in the PCB automated test equipment category by Frost & Sullivan. This distinguished award is a tremendous third-party validation of ASSET’s embedded instrumentation strategy, and is based upon our drive to reduce test costs in the face of increasingly complex test challenges...

A week at ITC

Alan Sguigna

November 12, 2010
5:26 am

Last week, ASSET unveiled the first toolkit for IEEE 1687 at the International Test Conference (ITC) in Austin, TX. ITC is the cornerstone of “Test Week”, a premiere technical event which addresses the challenges of providing high-quality, cost-effective test solutions for chips, boards and systems...

High Speed I/O Testing on In-Circuit Test

Alan Sguigna

November 4, 2010
6:19 pm

Because ASSET is a pioneer in the use of non-intrusive solutions for validation, test and debug (using what we call “embedded instrumentation”), we often get asked if legacy testers like In-Circuit Test (ICT) machines can be used for the testing of high-speed I/O...

Category: Industry Standards and Forums

What is P1838 3D test?

P1838: the 3D Standard and its use with 1687

What is JTAG? and What is IJTAG?

IEEE P1687 and In-Circuit Test (ICT)

The test stack

Test coverage using multiple technologies

Structural versus Functional Test, and Test Coverage versus Diagnostics

ASSET receives prestigious Frost & Sullivan award

A week at ITC

High Speed I/O Testing on In-Circuit Test

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