Non-intrusive Board Test (NBT) Archives | Page 5 of 7

Be an expert where it matters most to your customer

Larry Osborn

August 30, 2012
9:26 am

When you come right down to it, we spend too many days/nights, weeks and weekends writing code for device configuration, production test and system test. The question I’d like to raise is: What is the value of these home grown tests? Do they provide intrinsic and tangible value to your end customer?

Testing Intel QuickPath Interconnect

Alan Sguigna

August 26, 2012
3:11 pm

Last week I published a blog on detecting defects on PCI Express. Does Intel QuickPath Interconnect (QPI) differ in any way?

Testing PCI Express

Alan Sguigna

August 16, 2012
8:16 pm

PCI Express (PCIe) buses, in particularly Gen3, are susceptible to defects which may be masked from conventional test. What are these defects and how are they detected?

Motherboard failures

Larry Osborn

August 13, 2012
1:52 pm

Ever have a PC die after a couple weeks or just after the warranty expires? Or perhaps the PC never powered up! Or maybe you have features like USB, a display or camera on the PC that don’t work. So you attempt to return it to the store where you purchased it only to find that it has to go back to the manufacturer. Ever wonder where those motherboards or laptop returns go? Or do you wonder how or why the faulty product ever shipped in the first place? I’ll first address the question of repair and then quality.

Testing DDR3 and DDR4 memory – Part 2

Alan Sguigna

August 3, 2012
4:52 pm

In my last Blog, I wrote about the iNEMI report on how testing memories is one of the top three problems engineers face today. Why is memory test so important?

How to test DDR3, DDR4 and other memory buses is top-of-mind for many engineers. And rightfully so.

Alan Sguigna

July 25, 2012
2:55 pm

Testing high-speed memories soldered to a circuit board is as elusive as it is critical for overall system performance. Testing DDR3 and DDR4 memory buses can be particularly tricky, given the fact that DDR is so fast and that the bus carries the clock and data on both the rising and falling edges of the signal. Sorting all of that out and making sure it stays sorted out over the life cycle of a system can be a daunting challenge.

Why invest in new test technology – Part 2

Alan Sguigna

July 4, 2012
3:32 pm

Readers of my previous Blog will have seen that investing in new test technology might be a smart thing to do, to save your company money. And if you save your company money, you’ll be a hero. Let’s dive into this a little deeper.

You, our users, show us the full potential of new boundary-scan test tools

Kent Zetterberg

July 2, 2012
10:53 am

Why invest in new test technology?

Alan Sguigna

June 24, 2012
8:17 pm

Companies sometimes are reluctant to invest in Test because they consider it a cost center. And, of course, there’s that tried-but-true adage, “if it ain’t broke, don’t fix it”. But investing in the right tester can dramatically lower overall costs. How do we prove this in financially?

The Limitations of Boundary Scan on ICT

Alan Sguigna

May 28, 2012
4:12 pm

Many legacy In-Circuit Testers (ICT) support some kind of boundary scan for structural testing, to address limited access issues. But are these as good as advertised?

Category: Non-intrusive Board Test (NBT)

Be an expert where it matters most to your customer

Testing Intel QuickPath Interconnect

Testing PCI Express

Motherboard failures

Testing DDR3 and DDR4 memory – Part 2

How to test DDR3, DDR4 and other memory buses is top-of-mind for many engineers. And rightfully so.

Why invest in new test technology – Part 2

You, our users, show us the full potential of new boundary-scan test tools

Why invest in new test technology?

The Limitations of Boundary Scan on ICT

Archives

Categories