Category: Non-intrusive Board Test (NBT)

Flying Probe Testers and Boundary Scan

Alan Sguigna

May 13, 2012
9:47 am

Today’s flying probe testers can give high structural test coverage, making them ideal for prototype board bring-up and low-volume manufacturing. But they can be darned slow. Can boundary scan help?

What is Board Bring-Up, and why does it take so long?

Alan Sguigna

March 21, 2012
3:48 pm

Board bring-up is a phased process whereby an electronics system is repeatedly tested, validated and debugged, in order to achieve readiness for manufacture. This process can take so long that a product never gets to market because it is succeeded by the next generation...

Arguing in the Lab?… Never during board bring-up

Larry Osborn

February 11, 2012
8:25 am

Why you need boundary scan in your board bring-up toolset

Kent Zetterberg

January 26, 2012
1:50 pm

The Coming Crisis in Board Bring-Up

Alan Sguigna

December 4, 2011
7:18 pm

I was reflecting on how much processor speeds, memory, and data transmission rates have increased over the last few decades. And yet the same old tools and techniques are often used to bring up new designs. When do you think we fall off the cliff?

Don’t be Intrusive!

Alan Sguigna

October 8, 2011
3:48 pm

Ever heard the old saw about the guy (gal) that “went to a fight and a hockey game broke out”? I’d characterize the ongoing debate on the value and longevity of In-Circuit Test (ICT) as a bit of a brawl…

PCT Detects Link Training Failures

Alan Sguigna

August 8, 2011
10:47 am

One of our customers was experiencing field returns when 10 Gigabit Ethernet ports started failing to pass traffic at full line rate. How could they test for these failing boards in manufacturing and prevent them from getting out to customers?

Board Bring-Up

Alan Sguigna

July 17, 2011
4:28 pm

Board bring up of an early prototype is one of the most important steps for a design team. The first boards must pass through a battery of tests to demonstrate that the hardware is rock-solid. Non-intrusive technologies can be used to accelerate this process.

IEEE P1687 and In-Circuit Test (ICT)

Alan Sguigna

June 5, 2011
9:43 am

Run IEEE P1687-based tests at ICT? I don't think so...

Category: Non-intrusive Board Test (NBT)

Flying Probe Testers and Boundary Scan

What is Board Bring-Up, and why does it take so long?

Arguing in the Lab?… Never during board bring-up

Why you need boundary scan in your board bring-up toolset

The Coming Crisis in Board Bring-Up

Don’t be Intrusive!

PCT Detects Link Training Failures

Board Bring-Up

IEEE P1687 and In-Circuit Test (ICT)

More Problems with In-Circuit Test

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