Blog

The origins of JTAG are inextricably bound up with boundary scan. Yet, it provides many capabilities to many purposes. Often, as part of a point tool, whether for debug, programming, test or validation, it takes on just one capability. But, no matter the purpose, as the thread common to all, the standard Test Access Port (TAP) opens the way for many applications. In the test domain, several of these unite under the banner Non-intrusive Board Test (NBT).
In the previous blog on PCB Insertion Loss and High-Speed Buses, we described how this loss increases with greater link speed. Designing for higher link speeds may, as a consequence, drive up PCB cost. This blog explains some techniques to mitigate this cost increase.
A leading server OEM is using an embedded implementation of Intel In-Target Probe (ITP) to perform at-scale debugging, without plugging in an external emulator. How does this work?
Archives