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Determining the margins of a system requires taking a statistically large-enough data collection sample size to achieve a meaningful result. The sample size takes into account variances due to silicon process, temperature, voltage, finite test time, and a number of other factors. What is the math behind this?
We know that the board bring-up process can be extremely challenging on todayโ€™s complex, high-speed designs. How do we get the iterative validation, test and debug steps off of the critical path of new product introduction?
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