Blog

Motherboard failures

Larry Osborn

August 13, 2012
1:52 pm

Ever have a PC die after a couple weeks or just after the warranty expires? Or perhaps the PC never powered up! Or maybe you have features like USB, a display or camera on the PC that don’t work. So you attempt to return it to the store where you purchased it only to find that it has to go back to the manufacturer. Ever wonder where those motherboards or laptop returns go? Or do you wonder how or why the faulty product ever shipped in the first place? I’ll first address the question of repair and then quality.

Testing DDR3 and DDR4 memory – Part 2

Alan Sguigna

August 3, 2012
4:52 pm

In my last Blog, I wrote about the iNEMI report on how testing memories is one of the top three problems engineers face today. Why is memory test so important?

How to test DDR3, DDR4 and other memory buses is top-of-mind for many engineers. And rightfully so.

Alan Sguigna

July 25, 2012
2:55 pm

Testing high-speed memories soldered to a circuit board is as elusive as it is critical for overall system performance. Testing DDR3 and DDR4 memory buses can be particularly tricky, given the fact that DDR is so fast and that the bus carries the clock and data on both the rising and falling edges of the signal. Sorting all of that out and making sure it stays sorted out over the life cycle of a system can be a daunting challenge.

Why invest in new test technology – Part 2

Alan Sguigna

July 4, 2012
3:32 pm

Readers of my previous Blog will have seen that investing in new test technology might be a smart thing to do, to save your company money. And if you save your company money, you’ll be a hero. Let’s dive into this a little deeper.

You, our users, show us the full potential of new boundary-scan test tools

Kent Zetterberg

July 2, 2012
10:53 am

Why invest in new test technology?

Alan Sguigna

June 24, 2012
8:17 pm

Companies sometimes are reluctant to invest in Test because they consider it a cost center. And, of course, there’s that tried-but-true adage, “if it ain’t broke, don’t fix it”. But investing in the right tester can dramatically lower overall costs. How do we prove this in financially?

Embedded Run-Control for Debug and Test

Alan Sguigna

June 20, 2012
8:40 pm

Embedded run-control (aka on-chip debug, or processor debug port control) has numerous benefits in the areas of test and debug, for Design Engineering, Manufacturing Test Engineering, and Field Service. What are they?

The Limitations of Boundary Scan on ICT

Alan Sguigna

May 28, 2012
4:12 pm

Many legacy In-Circuit Testers (ICT) support some kind of boundary scan for structural testing, to address limited access issues. But are these as good as advertised?

Pollution, Power Margins, and SerDes Problems

Alan Sguigna

May 20, 2012
8:59 pm

Flying Probe Testers and Boundary Scan

Alan Sguigna

May 13, 2012
9:47 am

Today’s flying probe testers can give high structural test coverage, making them ideal for prototype board bring-up and low-volume manufacturing. But they can be darned slow. Can boundary scan help?

Motherboard failures

Testing DDR3 and DDR4 memory – Part 2

How to test DDR3, DDR4 and other memory buses is top-of-mind for many engineers. And rightfully so.

Why invest in new test technology – Part 2

You, our users, show us the full potential of new boundary-scan test tools

Why invest in new test technology?

Embedded Run-Control for Debug and Test

The Limitations of Boundary Scan on ICT

Pollution, Power Margins, and SerDes Problems

Flying Probe Testers and Boundary Scan

Archives

Categories