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Can Test be a strategic asset?

Alan Sguigna

February 26, 2012
1:27 pm

Martin Rowe, senior technical editor of Test & Measurement World magazine, posed this question in a recent blog. What do you think?

Fast Flash Programming

Alan Sguigna

February 12, 2012
4:07 pm

Programming NOR or large NAND flash devices can be done using a variety of technologies, including boundary scan (JTAG), processor-controlled test (emulation), or FPGA-controlled test. Which embedded instrument you use is a trade-off between speed, complexity and cost.

Arguing in the Lab?… Never during board bring-up

Larry Osborn

February 11, 2012
8:25 am

Brawny Servers vs. Wimpy Servers

Alan Sguigna

February 5, 2012
7:30 pm

You may not be able to kick sand into the faces of those wimpy servers in the data center much longer. The wimps are on the rise, even though they won’t take over the beach any time soon.

Overclockers Unite!

Alan Sguigna

January 29, 2012
4:31 pm

The new Sandy Bridge E (Enthusiast) processors are a gamer’s delight. With the new LGA2011 socket and X79 chipset, Intel Sandy Bridge-E series processors come with enhanced performance overclocking support. But is it worth the money?

Why you need boundary scan in your board bring-up toolset

Kent Zetterberg

January 26, 2012
1:50 pm

Performance versus Conformance Testing

Alan Sguigna

January 22, 2012
11:38 am

OEMs in the telecom industry invest in verifying the performance and conformance of the high-speed interconnects off their gear. Does the same approach apply to chip-to-chip interconnects, and in other industries?

Your laptop – are you getting what you paid for?

Alan Sguigna

January 1, 2012
3:49 pm

Many of us got new laptops, e-readers, tablets, and other electronics toys as gifts over the holidays. But do these machines run as fast as they’re supposed to?

The Coming Crisis in Board Bring-Up

Alan Sguigna

December 4, 2011
7:18 pm

I was reflecting on how much processor speeds, memory, and data transmission rates have increased over the last few decades. And yet the same old tools and techniques are often used to bring up new designs. When do you think we fall off the cliff?

Programming devices at In-Circuit Test?

Alan Sguigna

November 6, 2011
3:02 pm

I read a very interesting article recently making the case for programming PLDs and Flash Memory at In-Circuit Test (ICT). But there may be better alternatives - see what do you think...

Can Test be a strategic asset?

Fast Flash Programming

Arguing in the Lab?… Never during board bring-up

Brawny Servers vs. Wimpy Servers

Overclockers Unite!

Why you need boundary scan in your board bring-up toolset

Performance versus Conformance Testing

Your laptop – are you getting what you paid for?

The Coming Crisis in Board Bring-Up

Programming devices at In-Circuit Test?

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