Asset Logo
Contact Us
Asset Logo
Contact Us
Asset Logo
Search
Close this search box.

Blog

Test coverage using multiple technologies

Picture of Alan Sguigna
Alan Sguigna
It is a well-known fact that manufacturing test strategies must involve a combination of inspection, structural, and functional test technologies in order to yield highest quality and minimize customer returns. But a new breed of non-intrusive, software-based technologies promises to disrupt legacy test solutions by guaranteeing the highest test coverage at the lowest cost. These technologies leverage off of the embedded instruments within silicon to achieve this goal in the following ways...

Hope is not a strategy…

Picture of Glenn Woppman
Glenn Woppman
The world of validation has changed dramatically over the last few years due to the added challenge of increasing bus speeds. My observation across the industry is there are two camps companies are aligning on...

ASSET receives prestigious Frost & Sullivan award

Picture of Alan Sguigna
Alan Sguigna
ASSET has been awarded the prestigious 2010 Innovation of the Year Award in the PCB automated test equipment category by Frost & Sullivan. This distinguished award is a tremendous third-party validation of ASSET’s embedded instrumentation strategy, and is based upon our drive to reduce test costs in the face of increasingly complex test challenges...

A week at ITC

Picture of Alan Sguigna
Alan Sguigna
Last week, ASSET unveiled the first toolkit for IEEE 1687 at the International Test Conference (ITC) in Austin, TX. ITC is the cornerstone of “Test Week”, a premiere technical event which addresses the challenges of providing high-quality, cost-effective test solutions for chips, boards and systems...

High Speed I/O Testing on In-Circuit Test

Picture of Alan Sguigna
Alan Sguigna
Because ASSET is a pioneer in the use of non-intrusive solutions for validation, test and debug (using what we call “embedded instrumentation”), we often get asked if legacy testers like In-Circuit Test (ICT) machines can be used for the testing of high-speed I/O...

Rooting out impossible bugs

Picture of Alan Sguigna
Alan Sguigna
The use of effective embedded diagnostics to identify failures in today’s high-availability systems becomes more critical as semiconductor and board technologies increase in speed and integration. But many OEMs seem to be overlooking this vital aspect of their products’ post-sales operation...

In-Circuit Test—heavy metal blues

Picture of Alan Sguigna
Alan Sguigna
Once upon a time, circa mid-1980's, surface mount technology (SMT) was becoming all the rage and it was widely reported that in-circuit test (ICT) was doomed! But lo, ICT had (at least) nine lives and would not die - the purveyors of "heavy metal" kept (keep) coming up with new innovations to keep the heart of the beast ticking…

Ircona, IBIST, and a great Signal Integrity story

Picture of Alan Sguigna
Alan Sguigna
Ircona, a company specializing in high-speed processor-based designs and BIOS customization for partners including Phoenix Technologies, has recently used our Intel® Interconnect Built-In Self Test (IBIST) tool to troubleshoot some very elusive signal integrity issues on a high-end server design...

Who will use IEEE 1687?

Picture of Larry Osborn
Larry Osborn
The IEEE 1687 standard resonates with engineers and managers, no matter which part of the semiconductor-based product lifecycle they are involved with, because it either solves a technical problem, it provides a cost advantage, it reduces the amount of work, or it enables automation of some (onerous) task…
Archives
Categories
Asset Logo
ASSET InterTech, Inc.
7161 Bishop Road, Suite 250
Plano, TX USA 75024
 
Get in touch by phone:
(888) 694-6250

Copyright ©2024 ASSET InterTech, Inc. All rights reserved.