Blog

Hope is not a strategy…

Glenn Woppman

December 17, 2010
11:45 am

The world of validation has changed dramatically over the last few years due to the added challenge of increasing bus speeds. My observation across the industry is there are two camps companies are aligning on...

Structural versus Functional Test, and Test Coverage versus Diagnostics

Alan Sguigna

December 9, 2010
5:32 pm

What’s the difference between circuit board structural test and functional test? And how does test coverage relate to diagnostics? These terms are sometimes used interchangeably, but not knowing the difference may result in a less-than-optimal test methodology. Let me explain…

ASSET receives prestigious Frost & Sullivan award

Alan Sguigna

December 5, 2010
4:03 am

ASSET has been awarded the prestigious 2010 Innovation of the Year Award in the PCB automated test equipment category by Frost & Sullivan. This distinguished award is a tremendous third-party validation of ASSET’s embedded instrumentation strategy, and is based upon our drive to reduce test costs in the face of increasingly complex test challenges...

A week at ITC

Alan Sguigna

November 12, 2010
5:26 am

Last week, ASSET unveiled the first toolkit for IEEE 1687 at the International Test Conference (ITC) in Austin, TX. ITC is the cornerstone of “Test Week”, a premiere technical event which addresses the challenges of providing high-quality, cost-effective test solutions for chips, boards and systems...

High Speed I/O Testing on In-Circuit Test

Alan Sguigna

November 4, 2010
6:19 pm

Because ASSET is a pioneer in the use of non-intrusive solutions for validation, test and debug (using what we call “embedded instrumentation”), we often get asked if legacy testers like In-Circuit Test (ICT) machines can be used for the testing of high-speed I/O...

Rooting out impossible bugs

Alan Sguigna

September 26, 2010
2:55 pm

The use of effective embedded diagnostics to identify failures in today’s high-availability systems becomes more critical as semiconductor and board technologies increase in speed and integration. But many OEMs seem to be overlooking this vital aspect of their products’ post-sales operation...

In-Circuit Test—heavy metal blues

Alan Sguigna

September 25, 2010
8:16 pm

Once upon a time, circa mid-1980's, surface mount technology (SMT) was becoming all the rage and it was widely reported that in-circuit test (ICT) was doomed! But lo, ICT had (at least) nine lives and would not die - the purveyors of "heavy metal" kept (keep) coming up with new innovations to keep the heart of the beast ticking…

Ircona, IBIST, and a great Signal Integrity story

Alan Sguigna

September 14, 2010
5:36 am

Ircona, a company specializing in high-speed processor-based designs and BIOS customization for partners including Phoenix Technologies, has recently used our Intel® Interconnect Built-In Self Test (IBIST) tool to troubleshoot some very elusive signal integrity issues on a high-end server design...

Who will use IEEE 1687?

Larry Osborn

September 14, 2010
4:38 am

The IEEE 1687 standard resonates with engineers and managers, no matter which part of the semiconductor-based product lifecycle they are involved with, because it either solves a technical problem, it provides a cost advantage, it reduces the amount of work, or it enables automation of some (onerous) task…

No Trouble Found?

Alan Sguigna

September 1, 2010
11:33 am

In my earlier blog on Debugging Watchdog Timeouts I mentioned the dreaded No Trouble Found (NTF) problem. NTF is a huge cost to companies and is extremely difficult to quantify and to address. Something as simple as an errant wedding ring can cost companies millions of dollars. Let me explain…

Hope is not a strategy…

Structural versus Functional Test, and Test Coverage versus Diagnostics

ASSET receives prestigious Frost & Sullivan award

A week at ITC

High Speed I/O Testing on In-Circuit Test

Rooting out impossible bugs

In-Circuit Test—heavy metal blues

Ircona, IBIST, and a great Signal Integrity story

Who will use IEEE 1687?

No Trouble Found?

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