High Speed I/O Testing on In-Circuit Test: Comparisons and Alternatives
As a pioneer of non-intrusive solutions for validation, we at ASSET InterTech often get asked whether legacy In-Circuit Test (ICT) systems can still be used to test high-speed I/O buses. The short answer? It’s complicated. ICT has its place, but when it comes to high-speed signals, access limitations make things tricky. That said, there are […]
Improving and Removing Blind Spots in Medical Device Testing
Improving and Removing Bling Spots in Medical Device Testing In the realm of medical devices, precision isn’t optional—it’s imperative. Every circuit, sensor, and embedded system must perform flawlessly, because lives depend on it. Aligning ISO 13485, which is key for medical device quality systems, with IEEE 1149.1 (JTAG) is essential. IEEE 1149.1 is the standard […]
IEEE 1687 (IJTAG): ICL and PDL Explained
With IEEE 1687 (aka IJTAG) making its way into a great many chips as a mainstream mechanism for access and control of embedded instrumentation, I’ve taken an interest in explaining this often complicated technology in simple terms. I’ll start with describing the syntax, semantics and overall structure of Instrument Connectivity Language (ICL) and Procedural Description […]
Everything You Need to Know About ScanWorks Interconnect Part 2: The Boundary Scan Architecture
What is the meaning of the word “interconnect”? As the word is applied in the field of electronics, interconnect, as defined at Techopedia.com, defines the word as follows. “An interconnect (generally speaking) is a physical or logical connection between two electronic devices or networks.” Printed circuit boards (PCB) consisting of hundreds, sometimes, thousands, of interconnected […]