The IEEE 1149.1-2013 Standard for Test Access Port and Boundary-Scan Architecture: An Overview
Those who might follow me via our blog site, or on social media, know that I’ve written on numerous technical topics over the years, ranging from silicon aging to signal integrity to firmware debug. All of these blogs originate from my experience with JTAG, the underlying technology behind low-level test, chip and printed circuit board […]
Everything You Need to Know about ScanWorks Interconnect Part 3: Boundary Scan Device Instructions
In my last blog, I discussed the conditions that lead to the creation of the boundary scan standard, and I began to describe the internal boundary scan architecture inherent within each IEEE 1149.1 compliant device. As stated, boundary scan is a structural test technology for detecting shorts, opens, and stuck-at faults introduced during the printed […]
Everything You Need to Know About ScanWorks Interconnect Part 1: The Origins of Boundary Scan
To tell the story of Interconnect, we must go back in time to the printed circuit board (PCB) test industry prior to the year 1990. At that time, electronics manufacturers relied upon a hands-on approach to test PCBs for structural integrity. Typical PCB test technologies of the time included the use of equipment such as […]